Jason Ferns

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
LiDAR systems and methods for focusing on ranges of interest
- Patent number 12,276,759
- Issue date Apr 15, 2025
- SEYOND, INC.
- Rui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
LiDAR systems and methods for focusing on ranges of interest
- Patent number 11,860,313
- Issue date Jan 2, 2024
- Innovusion, Inc.
- Rui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
LiDAR systems and methods for focusing on ranges of interest
- Patent number 11,782,136
- Issue date Oct 10, 2023
- Innovusion, Inc.
- Rui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
LiDAR systems and methods for focusing on ranges of interest
- Patent number 11,675,053
- Issue date Jun 13, 2023
- Innovusion, Inc.
- Rui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Advanced optical sensor and method for detecting an optical event i...
- Patent number 10,692,705
- Issue date Jun 23, 2020
- Tokyo Electron Limited
- Mihail Mihaylov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endpoint detection algorithm for atomic layer etching (ALE)
- Patent number 10,453,653
- Issue date Oct 22, 2019
- Tokyo Electron Limited
- Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automated determination of an optimally parameterized sc...
- Patent number 8,666,703
- Issue date Mar 4, 2014
- Tokyo Electron Limited
- Jason Ferns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,395,132
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Daniel Prager
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,221,989
- Issue date May 22, 2007
- Tokyo Electron Limited
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,065,423
- Issue date Jun 20, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST
- Publication number 20230375676
- Publication date Nov 23, 2023
- Innovusion, Inc.
- Rui Zhang
- G02 - OPTICS
Information Patent Application
LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST
- Publication number 20220244359
- Publication date Aug 4, 2022
- Innovusion Ireland Limited
- Rui Zhang
- G02 - OPTICS
Information Patent Application
LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST
- Publication number 20190383911
- Publication date Dec 19, 2019
- Innovusion Ireland Limited
- Rui Zhang
- G01 - MEASURING TESTING
Information Patent Application
ENDPOINT DETECTION ALGORITHM FOR ATOMIC LAYER ETCHING (ALE)
- Publication number 20180068831
- Publication date Mar 8, 2018
- TOKYO ELECTRON LIMITED
- Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVANCED OPTICAL SENSOR AND METHOD FOR PLASMA CHAMBER
- Publication number 20170140905
- Publication date May 18, 2017
- TOKYO ELECTRON LIMITED
- Mihail Mihaylov
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AUTOMATED DETERMINATION OF AN OPTIMALLY PARAMETERIZED SC...
- Publication number 20120022836
- Publication date Jan 26, 2012
- TOKYO ELECTRON LIMITED
- Jason Ferns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20070225851
- Publication date Sep 27, 2007
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060247816
- Publication date Nov 2, 2006
- TOKYO ELECTRON LIMITED
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060009872
- Publication date Jan 12, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING

Jason Ferns

Person

Patents Grantslast 30 patents

LiDAR systems and methods for focusing on ranges of interest

LiDAR systems and methods for focusing on ranges of interest

LiDAR systems and methods for focusing on ranges of interest

LiDAR systems and methods for focusing on ranges of interest

Advanced optical sensor and method for detecting an optical event i...

Endpoint detection algorithm for atomic layer etching (ALE)

Method for automated determination of an optimally parameterized sc...

Optical metrology model optimization for process control

Optical metrology model optimization for process control

Optical metrology model optimization for process control

Patents Applicationslast 30 patents

LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST

LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST

LIDAR SYSTEMS AND METHODS FOR FOCUSING ON RANGES OF INTEREST

ENDPOINT DETECTION ALGORITHM FOR ATOMIC LAYER ETCHING (ALE)

ADVANCED OPTICAL SENSOR AND METHOD FOR PLASMA CHAMBER

METHOD FOR AUTOMATED DETERMINATION OF AN OPTIMALLY PARAMETERIZED SC...

Optical metrology model optimization for process control

Optical metrology model optimization for process control

Optical metrology model optimization for process control