Jason Gill

Person

Lagrange, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and structure for determining thermal cycle reliability
- Patent number 9,443,776
- Issue date Sep 13, 2016
- GLOBALFOUNDRIES, INC.
- Ronald G. Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and structure for determining thermal cycle reliability
- Patent number 9,287,186
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Micro-electro-mechanical-system temperature sensor
- Patent number 8,480,302
- Issue date Jul 9, 2013
- International Business Machines Corporation
- Jason P. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Low leakage metal-containing cap process using oxidation
- Patent number 7,867,897
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via bottom contact and method of manufacturing same
- Patent number 7,830,019
- Issue date Nov 9, 2010
- International Business Machines Corporation
- Kaushik Chanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for modeling stress-induced degradation of conductive int...
- Patent number 7,692,439
- Issue date Apr 6, 2010
- International Business Machines Corporation
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Grant
Structure for monitoring stress-induced degradation of conductive i...
- Patent number 7,639,032
- Issue date Dec 29, 2009
- International Business Machines Corporation
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Grant
Low leakage metal-containing cap process using oxidation
- Patent number 7,598,614
- Issue date Oct 6, 2009
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VIA bottom contact and method of manufacturing same
- Patent number 7,585,764
- Issue date Sep 8, 2009
- International Business Machines Corporation
- Kaushik Chanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,511,378
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive evaluation of microstructure and interface roughnes...
- Patent number 7,500,208
- Issue date Mar 3, 2009
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for monitoring stress-induced degradation of c...
- Patent number 7,397,260
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Grant
Structure for determining thermal cycle reliability
- Patent number 7,388,224
- Issue date Jun 17, 2008
- International Business Machines Corporation
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of grain sizes of electrically conductive lines in se...
- Patent number 7,231,617
- Issue date Jun 12, 2007
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for local resistor element in integrated circu...
- Patent number 7,166,904
- Issue date Jan 23, 2007
- International Business Machines Corporation
- Jason P. Gill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for determining thermal cycle reliability
- Patent number 7,098,054
- Issue date Aug 29, 2006
- International Business Machines Corporation
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,096,450
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND STRUCTURE FOR DETERMINING THERMAL CYCLE RELIABILITY
- Publication number 20150262899
- Publication date Sep 17, 2015
- International Business Machines Corporation
- RONALD G. FILIPPI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-ELECTRO-MECHANICAL-SYSTEM TEMPERATURE SENSOR
- Publication number 20120076172
- Publication date Mar 29, 2012
- International Business Machines Corporation
- Jason P. Gill
- G01 - MEASURING TESTING
Information Patent Application
LOW LEAKAGE METAL-CONTAINING CAP PROCESS USING OXIDATION
- Publication number 20100021656
- Publication date Jan 28, 2010
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA BOTTOM CONTACT AND METHOD OF MANUFACTURING SAME
- Publication number 20090200673
- Publication date Aug 13, 2009
- International Business Machines Corporation
- Kaushik Chanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methodology for Thermal Modeling of On-Chip Interconnects Based on...
- Publication number 20090164183
- Publication date Jun 25, 2009
- International Business Machines Corporation
- Howard Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Structure for modeling stress-induced degradation of conductive int...
- Publication number 20080231312
- Publication date Sep 25, 2008
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR DETERMINING THERMAL CYCLE RELIABILITY
- Publication number 20080224135
- Publication date Sep 18, 2008
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELL
- Publication number 20080173975
- Publication date Jul 24, 2008
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for monitoring stress-induced degradation of conductive inte...
- Publication number 20080107149
- Publication date May 8, 2008
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Application
LOW LEAKAGE METAL-CONTAINING CAP PROCESS USING OXIDATION
- Publication number 20070235875
- Publication date Oct 11, 2007
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT VIA SCHEME WITH STAGGERED VIAS
- Publication number 20070176295
- Publication date Aug 2, 2007
- International Business Machines Corporation
- Anil K. Chinthakindi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE EVALUATION OF MICROSTRUCTURE AND INTERFACE ROUGHNES...
- Publication number 20070130551
- Publication date Jun 7, 2007
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR MONITORING STRESS-INDUCED DEGRADATION OF C...
- Publication number 20070115018
- Publication date May 24, 2007
- International Business Machines Corporation
- Kaushik Chanda
- G01 - MEASURING TESTING
Information Patent Application
VIA BOTTOM CONTACT AND METHOD OF MANUFACTURING SAME
- Publication number 20070037403
- Publication date Feb 15, 2007
- International Business Machines Corporation
- Kaushik Chanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for determining thermal cycle reliability
- Publication number 20060273460
- Publication date Dec 7, 2006
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Enhancement of performance of a conductive wire in a multilayered s...
- Publication number 20060226142
- Publication date Oct 12, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE EVALUATION OF MICROSTRUCTURE AND INTERFACE ROUGHNES...
- Publication number 20060071676
- Publication date Apr 6, 2006
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for determining thermal cycle reliability
- Publication number 20050186689
- Publication date Aug 25, 2005
- Ronald Gene Filippi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STRUCTURE AND METHOD FOR LOCAL RESISTOR ELEMENT IN INTEGRATED CIRCU...
- Publication number 20050167786
- Publication date Aug 4, 2005
- International Business Machines Corporation
- Jason P. Gill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...
- Publication number 20040262031
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Method and structure for determining thermal cycle reliability

Method and structure for determining thermal cycle reliability

Micro-electro-mechanical-system temperature sensor

Low leakage metal-containing cap process using oxidation

Via bottom contact and method of manufacturing same

Structure for modeling stress-induced degradation of conductive int...

Structure for monitoring stress-induced degradation of conductive i...

Low leakage metal-containing cap process using oxidation

VIA bottom contact and method of manufacturing same

Enhancement of performance of a conductive wire in a multilayered s...

Non-destructive evaluation of microstructure and interface roughnes...

Structure and method for monitoring stress-induced degradation of c...

Structure for determining thermal cycle reliability

Determination of grain sizes of electrically conductive lines in se...

Structure and method for local resistor element in integrated circu...

Method and structure for determining thermal cycle reliability

Enhancement of performance of a conductive wire in a multilayered s...

Patents Applicationslast 30 patents

METHOD AND STRUCTURE FOR DETERMINING THERMAL CYCLE RELIABILITY

MICRO-ELECTRO-MECHANICAL-SYSTEM TEMPERATURE SENSOR

LOW LEAKAGE METAL-CONTAINING CAP PROCESS USING OXIDATION

VIA BOTTOM CONTACT AND METHOD OF MANUFACTURING SAME

Methodology for Thermal Modeling of On-Chip Interconnects Based on...

Structure for modeling stress-induced degradation of conductive int...

METHOD AND STRUCTURE FOR DETERMINING THERMAL CYCLE RELIABILITY

PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELL

Method for monitoring stress-induced degradation of conductive inte...

LOW LEAKAGE METAL-CONTAINING CAP PROCESS USING OXIDATION

CONTACT VIA SCHEME WITH STAGGERED VIAS

NON-DESTRUCTIVE EVALUATION OF MICROSTRUCTURE AND INTERFACE ROUGHNES...

STRUCTURE AND METHOD FOR MONITORING STRESS-INDUCED DEGRADATION OF C...

VIA BOTTOM CONTACT AND METHOD OF MANUFACTURING SAME

Method and structure for determining thermal cycle reliability

Enhancement of performance of a conductive wire in a multilayered s...

NON-DESTRUCTIVE EVALUATION OF MICROSTRUCTURE AND INTERFACE ROUGHNES...

Method and structure for determining thermal cycle reliability

STRUCTURE AND METHOD FOR LOCAL RESISTOR ELEMENT IN INTEGRATED CIRCU...

ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...