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Jason Habermehl
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Quebec city, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Ultrasonic TFM with calculated angle beams
Patent number
11,029,289
Issue date
Jun 8, 2021
Olympus America Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Grant
Total focusing method adaptively corrected by using plane wave
Patent number
10,908,122
Issue date
Feb 2, 2021
Olympus America Inc.
Benoit Lepage
G01 - MEASURING TESTING
Information
Patent Grant
Water wedge for flexible probe
Patent number
10,564,131
Issue date
Feb 18, 2020
Olympus Scientific Solutions Americas Inc.
Nicolas Badeau
G01 - MEASURING TESTING
Information
Patent Grant
System and method of non-destructive inspection with a visual scann...
Patent number
10,156,548
Issue date
Dec 18, 2018
Olympus Scientific Solutions Americas Inc.
Pierre Langlois
G01 - MEASURING TESTING
Information
Patent Grant
Focusing wedge for ultrasonic testing
Patent number
9,952,183
Issue date
Apr 24, 2018
Olympus Scientific Solutions America
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Automatic calibration for phased array inspection of girth weld
Patent number
9,476,859
Issue date
Oct 25, 2016
Olympus NDT, Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Grant
Method and system of using 1.5D phased array probe for cylindrical...
Patent number
9,080,951
Issue date
Jul 14, 2015
Olympus Scientific Solutions Americas Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Grant
Multi-frequency bond testing
Patent number
8,700,342
Issue date
Apr 15, 2014
Olympus NDT Inc.
Benoit Lepage
G01 - MEASURING TESTING
Information
Patent Grant
Method of manipulating impedance plane with a multi-point touch on...
Patent number
8,698,778
Issue date
Apr 15, 2014
Olympus NDT
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Grant
System and method of conducting refraction angle verification for p...
Patent number
8,521,446
Issue date
Aug 27, 2013
Olympus NDT Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for automatic wedge identification for an ultraso...
Patent number
8,150,652
Issue date
Apr 3, 2012
Olympus NDT
Kirk M. Rager
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Patents Applications
last 30 patents
Information
Patent Application
ULTRASONIC TFM WITH CALCULATED ANGLE BEAMS
Publication number
20180180578
Publication date
Jun 28, 2018
Olympus Scientific Solutions Americas Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
PHASED ARRAY WELD INSPECTION SYSTEM WITH ASSISTED ANALYSIS TOOLS
Publication number
20180113100
Publication date
Apr 26, 2018
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Application
WATER WEDGE FOR FLEXIBLE PROBE
Publication number
20170336366
Publication date
Nov 23, 2017
Olympus Scientific Solutions Americas Inc.
Nicolas Badeau
G01 - MEASURING TESTING
Information
Patent Application
TOTAL FOCUSING METHOD ADAPTIVELY CORRECTED BY USING PLANE WAVE
Publication number
20170284972
Publication date
Oct 5, 2017
Olympus Scientific Solutions Americas Inc.
Benoit Lepage
G01 - MEASURING TESTING
Information
Patent Application
FOCUSING WEDGE FOR ULTRASONIC TESTING
Publication number
20170074831
Publication date
Mar 16, 2017
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC CALIBRATION FOR PHASED ARRAY INSPECTION OF GIRTH WELD
Publication number
20150168355
Publication date
Jun 18, 2015
Jason HABERMEHL
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF NON-DESTRUCTIVE INSPECTION WITH A VISUAL SCANN...
Publication number
20150039245
Publication date
Feb 5, 2015
Olympus NDT Inc.
Pierre Langlois
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND A METHOD OF ADAPTIVE FOCUSING IN A PHASED ARRAY ULTRASON...
Publication number
20140283611
Publication date
Sep 25, 2014
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANIPULATING IMPEDANCE PLANE WITH A MULTI-POINT TOUCH ON...
Publication number
20140028608
Publication date
Jan 30, 2014
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM OF USING 1.5D PHASED ARRAY PROBE FOR CYLINDRICAL...
Publication number
20130283918
Publication date
Oct 31, 2013
Olympus NDT Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF CONDUCTING REFRACTION ANGLE VERIFICATION FOR P...
Publication number
20120130653
Publication date
May 24, 2012
Olympus NDT, Inc.
Jinchi ZHANG
G01 - MEASURING TESTING
Information
Patent Application
PROBE HOLDER ADJUSTABLE TO CONFORM TO TEST SURFACES
Publication number
20120006132
Publication date
Jan 12, 2012
Denis Faucher
G01 - MEASURING TESTING
Information
Patent Application
MULTI-FREQUENCY BOND TESTING
Publication number
20110118991
Publication date
May 19, 2011
Benoit LEPAGE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR AUTOMATIC WEDGE IDENTIFICATION FOR AN ULTRASO...
Publication number
20100250151
Publication date
Sep 30, 2010
Kirk M. RAGER
G10 - MUSICAL INSTRUMENTS ACOUSTICS