Jason Kirkwood

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Laser anneal pattern suppression
- Patent number 12,100,132
- Issue date Sep 24, 2024
- KLA Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect size measurement using deep learning methods
- Patent number 11,774,371
- Issue date Oct 3, 2023
- KLA Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for characterization of buried defects
- Patent number 10,854,486
- Issue date Dec 1, 2020
- KLA Corporation
- Jason Kirkwood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 10,605,744
- Issue date Mar 31, 2020
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for speckle suppression in laser dark-field s...
- Patent number 10,067,072
- Issue date Sep 4, 2018
- KLA-Tencor Corporation
- Vaibhav Gaind
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 9,880,107
- Issue date Jan 30, 2018
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data perturbation for wafer inspection or metrology setup using a m...
- Patent number 9,360,863
- Issue date Jun 7, 2016
- KLA-Tencor Corp.
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated inspection scenario generation
- Patent number 9,053,390
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,467,047
- Issue date Jun 18, 2013
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,223,327
- Issue date Jul 17, 2012
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for select...
- Patent number 8,049,877
- Issue date Nov 1, 2011
- KLA-Tencor Corp.
- Richard Wallingford
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser Anneal Pattern Suppression
- Publication number 20230122514
- Publication date Apr 20, 2023
- KLA Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT SIZE MEASUREMENT USING DEEP LEARNING METHODS
- Publication number 20210364450
- Publication date Nov 25, 2021
- KLA Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Characterization of Buried Defects
- Publication number 20200090969
- Publication date Mar 19, 2020
- KLA-Tencor Corporation
- Jason Kirkwood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20180202943
- Publication date Jul 19, 2018
- KLA-Tencor Corporation
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR SPECKLE SUPPRESSION IN LASER DARK-FIELD S...
- Publication number 20170011495
- Publication date Jan 12, 2017
- KLA-Tencor Corporation
- Vaibhav Gaind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Inspection Scenario Generation
- Publication number 20140050389
- Publication date Feb 20, 2014
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20130250287
- Publication date Sep 26, 2013
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20120268735
- Publication date Oct 25, 2012
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
Data Perturbation for Wafer Inspection or Metrology Setup
- Publication number 20120116733
- Publication date May 10, 2012
- KLA-Tencor Corporation
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20100188657
- Publication date Jul 29, 2010
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...
- Publication number 20090284733
- Publication date Nov 19, 2009
- Richard Wallingford
- G01 - MEASURING TESTING

Jason Kirkwood

Person

Patents Grantslast 30 patents

Laser anneal pattern suppression

Defect size measurement using deep learning methods

System and method for characterization of buried defects

Systems and methods for detecting defects on a wafer

Methods and apparatus for speckle suppression in laser dark-field s...

Systems and methods for detecting defects on a wafer

Data perturbation for wafer inspection or metrology setup using a m...

Automated inspection scenario generation

Systems and methods for detecting defects on a wafer

Systems and methods for detecting defects on a wafer

Computer-implemented methods, carrier media, and systems for select...

Patents Applicationslast 30 patents

Laser Anneal Pattern Suppression

DEFECT SIZE MEASUREMENT USING DEEP LEARNING METHODS

System and Method for Characterization of Buried Defects

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER

METHODS AND APPARATUS FOR SPECKLE SUPPRESSION IN LASER DARK-FIELD S...

Automated Inspection Scenario Generation

Systems and Methods for Detecting Defects on a Wafer

Systems and Methods for Detecting Defects on a Wafer

Data Perturbation for Wafer Inspection or Metrology Setup

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...