Jason M. Johnson

Person

Meridian, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Memory with per die temperature-compensated refresh control
- Patent number 12,315,550
- Issue date May 27, 2025
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test mode security circuit
- Patent number 12,100,476
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Kari Crane
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses, systems, and methods for error correction
- Patent number 12,079,076
- Issue date Sep 3, 2024
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Configurable resistivity for lines in a memory device
- Patent number 12,040,014
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Koushik Banerjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Asynchronous signal to command timing calibration for testing accuracy
- Patent number 11,955,160
- Issue date Apr 9, 2024
- Micron Technolgy, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with per die temperature-compensated refresh control
- Patent number 11,776,612
- Issue date Oct 3, 2023
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for refresh address masking
- Patent number 11,670,356
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for fuse error detection
- Patent number 11,645,134
- Issue date May 9, 2023
- Micron Technology, Inc.
- Daniel S. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory apparatus with redundancy array
- Patent number 11,593,201
- Issue date Feb 28, 2023
- Micron Technology, Inc.
- Seth Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data compression for global column repair
- Patent number 11,538,546
- Issue date Dec 27, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Encoding test data of microelectronic devices, and related methods,...
- Patent number 11,508,453
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Configurable resistivity for lines in a memory device
- Patent number 11,495,293
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Koushik Banerjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device testing, and associated methods, devices, and systems
- Patent number 11,456,049
- Issue date Sep 27, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Interconnected command/address resources
- Patent number 11,342,042
- Issue date May 24, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses, systems, and methods for error correction
- Patent number 11,263,078
- Issue date Mar 1, 2022
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus with a calibration mechanism
- Patent number 11,264,069
- Issue date Mar 1, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing based arbitration methods and apparatuses for calibrating im...
- Patent number 11,212,142
- Issue date Dec 28, 2021
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with per die temperature-compensated refresh control
- Patent number 11,200,939
- Issue date Dec 14, 2021
- Micron Technology, Inc.
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmit line monitoring circuitry, and related methods, devices, a...
- Patent number 11,183,260
- Issue date Nov 23, 2021
- Micron Technology Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device random option inversion
- Patent number 11,081,166
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Kevin G. Werhane
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory read masking
- Patent number 10,930,327
- Issue date Feb 23, 2021
- Micron Technology, Inc.
- Dave Jefferson
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for multi-bank refresh timing
- Patent number 10,923,172
- Issue date Feb 16, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus with a calibration mechanism
- Patent number 10,896,704
- Issue date Jan 19, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for impedance calibration of a semiconductor de...
- Patent number 10,886,918
- Issue date Jan 5, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing based arbitration methods and apparatuses for calibrating im...
- Patent number 10,855,495
- Issue date Dec 1, 2020
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatuses and methods for multi-bank refresh timing
- Patent number 10,593,392
- Issue date Mar 17, 2020
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing based arbitration methods and apparatuses for calibrating im...
- Patent number 10,530,613
- Issue date Jan 7, 2020
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory apparatus with redundancy array
- Patent number 10,514,983
- Issue date Dec 24, 2019
- Micron Technology, Inc.
- Seth Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus with a calibration mechanism
- Patent number 10,504,571
- Issue date Dec 10, 2019
- Microa Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION
- Publication number 20250021435
- Publication date Jan 16, 2025
- Lodestar Licensing Group LLC
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE
- Publication number 20240379157
- Publication date Nov 14, 2024
- Micron Technology, Inc.
- Koushik Banerjee
- G11 - INFORMATION STORAGE
Information Patent Application
TEST MODE SECURITY CIRCUIT
- Publication number 20240087625
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- Kari Crane
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...
- Publication number 20240071560
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL
- Publication number 20240062801
- Publication date Feb 22, 2024
- Lodestar Licensing Group LLC
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING MUTLIPLE BIT LINES WITH A SAM...
- Publication number 20240029781
- Publication date Jan 25, 2024
- Micron Technology, Inc.
- JOHN F. SCHRECK
- G11 - INFORMATION STORAGE
Information Patent Application
ASYNCHRONOUS SIGNAL TO COMMAND TIMING CALIBRATION FOR TESTING ACCURACY
- Publication number 20230420030
- Publication date Dec 28, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE
- Publication number 20230114440
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Koushik Banerjee
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REFRESH ADDRESS MASKING
- Publication number 20230020753
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION
- Publication number 20220156148
- Publication date May 19, 2022
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL
- Publication number 20220101913
- Publication date Mar 31, 2022
- Micron Technology, Inc.
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENCODING TEST DATA OF MICROELECTRONIC DEVICES, AND RELATED METHODS...
- Publication number 20220059177
- Publication date Feb 24, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G01 - MEASURING TESTING
Information Patent Application
MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL
- Publication number 20220005523
- Publication date Jan 6, 2022
- Micron Technology, Inc.
- James S. Rehmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE TESTING, AND ASSOCIATED METHODS, DEVICES, AND SYSTEMS
- Publication number 20220005541
- Publication date Jan 6, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
INTERCONNECTED COMMAND/ADDRESS RESOURCES
- Publication number 20210304838
- Publication date Sep 30, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE
- Publication number 20210241828
- Publication date Aug 5, 2021
- Micron Technology, Inc.
- Koushik Banerjee
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION
- Publication number 20210200629
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA COMPRESSION FOR GLOBAL COLUMN REPAIR
- Publication number 20210183461
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS WITH A CALIBRATION MECHANISM
- Publication number 20210110855
- Publication date Apr 15, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...
- Publication number 20210083909
- Publication date Mar 18, 2021
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR FUSE ERROR DETECTION
- Publication number 20210055981
- Publication date Feb 25, 2021
- Micron Technology, Inc.
- Daniel S. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR MULTI-BANK REFRESH TIMING
- Publication number 20200211635
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS WITH A CALIBRATION MECHANISM
- Publication number 20200111516
- Publication date Apr 9, 2020
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY APPARATUS WITH REDUNDANCY ARRAY
- Publication number 20200081782
- Publication date Mar 12, 2020
- Micron Technology, Inc.
- Seth Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR IMPEDANCE CALIBRATION OF A SEMICONDUCTOR DE...
- Publication number 20200059232
- Publication date Feb 20, 2020
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...
- Publication number 20200036560
- Publication date Jan 30, 2020
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHODS AND APPARATUSES FOR DYNAMIC STEP SIZE FOR IMPEDANCE CALIBRA...
- Publication number 20190238133
- Publication date Aug 1, 2019
- Micron Technology, Inc.
- Jason M. Johnson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SINGLE INTERCONNECT INDEX POINTER FOR STACKED DIE ADDRESS ENCODING
- Publication number 20190086469
- Publication date Mar 21, 2019
- Micron Technology, Inc.
- Kevin Gustav Werhane
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...
- Publication number 20190036740
- Publication date Jan 31, 2019
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...
- Publication number 20180375692
- Publication date Dec 27, 2018
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE

Jason M. Johnson

Person

Patents Grantslast 30 patents

Memory with per die temperature-compensated refresh control

Test mode security circuit

Systems and methods for testing redundant fuse latches in a memory...

Apparatuses, systems, and methods for error correction

Configurable resistivity for lines in a memory device

Asynchronous signal to command timing calibration for testing accuracy

Memory with per die temperature-compensated refresh control

Apparatuses and methods for refresh address masking

Apparatuses and methods for fuse error detection

Memory apparatus with redundancy array

Data compression for global column repair

Encoding test data of microelectronic devices, and related methods,...

Configurable resistivity for lines in a memory device

Memory device testing, and associated methods, devices, and systems

Interconnected command/address resources

Apparatuses, systems, and methods for error correction

Apparatus with a calibration mechanism

Timing based arbitration methods and apparatuses for calibrating im...

Memory with per die temperature-compensated refresh control

Transmit line monitoring circuitry, and related methods, devices, a...

Memory device random option inversion

Memory read masking

Apparatuses and methods for multi-bank refresh timing

Apparatus with a calibration mechanism

Systems and methods for impedance calibration of a semiconductor de...

Timing based arbitration methods and apparatuses for calibrating im...

Apparatuses and methods for multi-bank refresh timing

Timing based arbitration methods and apparatuses for calibrating im...

Memory apparatus with redundancy array

Apparatus with a calibration mechanism

Patents Applicationslast 30 patents

APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE

TEST MODE SECURITY CIRCUIT

SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...

MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL

APPARATUSES AND METHODS FOR REPAIRING MUTLIPLE BIT LINES WITH A SAM...

ASYNCHRONOUS SIGNAL TO COMMAND TIMING CALIBRATION FOR TESTING ACCURACY

CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE

APPARATUSES AND METHODS FOR REFRESH ADDRESS MASKING

APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL

ENCODING TEST DATA OF MICROELECTRONIC DEVICES, AND RELATED METHODS...

MEMORY WITH PER DIE TEMPERATURE-COMPENSATED REFRESH CONTROL

MEMORY DEVICE TESTING, AND ASSOCIATED METHODS, DEVICES, AND SYSTEMS

INTERCONNECTED COMMAND/ADDRESS RESOURCES

CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE

APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

DATA COMPRESSION FOR GLOBAL COLUMN REPAIR

APPARATUS WITH A CALIBRATION MECHANISM

TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...

APPARATUSES AND METHODS FOR FUSE ERROR DETECTION

APPARATUSES AND METHODS FOR MULTI-BANK REFRESH TIMING

APPARATUS WITH A CALIBRATION MECHANISM

MEMORY APPARATUS WITH REDUNDANCY ARRAY

SYSTEMS AND METHODS FOR IMPEDANCE CALIBRATION OF A SEMICONDUCTOR DE...

TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...

METHODS AND APPARATUSES FOR DYNAMIC STEP SIZE FOR IMPEDANCE CALIBRA...

SINGLE INTERCONNECT INDEX POINTER FOR STACKED DIE ADDRESS ENCODING

TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...

TIMING BASED ARBITRATION METHODS AND APPARATUSES FOR CALIBRATING IM...