Jason Phillip Cain

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Metal track cutting in standard cell layouts
- Patent number 9,837,398
- Issue date Dec 5, 2017
- Advanced Micro Devices, Inc.
- Omid Rowhani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Advanced process control framework using two-dimensional image anal...
- Patent number 7,875,851
- Issue date Jan 25, 2011
- Advanced Micro Devices, Inc.
- Chris Haidinyak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Incorporating film optical property measurements into scatterometry...
- Patent number 7,663,766
- Issue date Feb 16, 2010
- Advanced Micro Devices, Inc.
- Carsten Hartig
- G01 - MEASURING TESTING
Information Patent Grant
Scanner optimization for reduced across-chip performance variation...
- Patent number 7,460,922
- Issue date Dec 2, 2008
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Transistor gate shape metrology using multiple data sources
- Patent number 7,373,215
- Issue date May 13, 2008
- Advanced Micro Devices, Inc.
- Jason Phillip Cain
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PERFORMING DOUBLE EXPOSURE PHOTOLITHOGRAPHY USING A SINGLE RETICLE
- Publication number 20100310972
- Publication date Dec 9, 2010
- Jason P. Cain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MONITORING OPTICAL PROXIMITY CORRECTION PE...
- Publication number 20090144692
- Publication date Jun 4, 2009
- Jason P. Cain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MONITORING MARGINAL LAYOUT DESIGN RULES
- Publication number 20090144686
- Publication date Jun 4, 2009
- KEVIN R. LENSING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING METROLOGY TAGS TO ALLOW AUTOMAT...
- Publication number 20090082897
- Publication date Mar 26, 2009
- Jason P. Cain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INCORPORATING FILM OPTICAL PROPERTY MEASUREMENTS INTO SCATTEROMETRY...
- Publication number 20090059240
- Publication date Mar 5, 2009
- Carsten Hartig
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR GATE SHAPE METROLOGY USING MULTIPLE DATA SOURCES
- Publication number 20080058978
- Publication date Mar 6, 2008
- Advanced Micro Devices, Inc.
- Jason Phillip Cain
- G06 - COMPUTING CALCULATING COUNTING