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Jason S. Wegge
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Springfield, MA, US
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last 30 patents
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Patent Grant
Crack monitoring apparatus
Patent number
5,673,203
Issue date
Sep 30, 1997
United Technologies Corporation
Balkrishna S. Annigeri
G01 - MEASURING TESTING
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Patent Grant
Crack monitoring apparatus
Patent number
5,539,656
Issue date
Jul 23, 1996
United Technologies Corporation
Balkrishna S. Annigeri
G01 - MEASURING TESTING
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Patent Grant
High temperature crack monitoring apparatus
Patent number
5,517,861
Issue date
May 21, 1996
United Technologies Corporation
Robert J. Haas
G01 - MEASURING TESTING