Jason S. Wegge

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Springfield, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Crack monitoring apparatus
- Patent number 5,673,203
- Issue date Sep 30, 1997
- United Technologies Corporation
- Balkrishna S. Annigeri
- G01 - MEASURING TESTING
Information Patent Grant
Crack monitoring apparatus
- Patent number 5,539,656
- Issue date Jul 23, 1996
- United Technologies Corporation
- Balkrishna S. Annigeri
- G01 - MEASURING TESTING
Information Patent Grant
High temperature crack monitoring apparatus
- Patent number 5,517,861
- Issue date May 21, 1996
- United Technologies Corporation
- Robert J. Haas
- G01 - MEASURING TESTING