Jason Saito

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for determining post bonding overlay
- Patent number 11,829,077
- Issue date Nov 28, 2023
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Removable opaque coating for accurate optical topography measuremen...
- Patent number 11,049,720
- Issue date Jun 29, 2021
- KLA Corporation
- Dieter Mueller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and systems for identifying defect types on a wafer
- Patent number 7,728,969
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Jason Saito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
- Publication number 20240094642
- Publication date Mar 21, 2024
- KLA Corporation
- Franz Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
- Publication number 20220187718
- Publication date Jun 16, 2022
- KLA Corporation
- Franz Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
REMOVABLE OPAQUE COATING FOR ACCURATE OPTICAL TOPOGRAPHY MEASUREMEN...
- Publication number 20200126786
- Publication date Apr 23, 2020
- KLA Corporation
- Dieter Mueller
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING DEFECT TYPES ON A WAFER
- Publication number 20080129988
- Publication date Jun 5, 2008
- Jason Saito
- G01 - MEASURING TESTING