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JASON T. RYAN
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FREDERICK, MD, US
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Patents Grants
last 30 patents
Information
Patent Grant
Non-resonant electron spin resonant probe and associated hardware
Patent number
11,294,075
Issue date
Apr 5, 2022
Government of the United States of America as represented by the Secretary of...
Jason Campbell
G01 - MEASURING TESTING
Information
Patent Grant
Phase shift detector process for making and use of same
Patent number
10,247,814
Issue date
Apr 2, 2019
National Institute of Standards and Technology
Kin P. Cheung
G01 - MEASURING TESTING
Information
Patent Grant
Electron spin resonance spectrometer and method for using same
Patent number
9,507,004
Issue date
Nov 29, 2016
The Government of the United States of America, as represented by the Secreta...
Jason P. Campbell
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
NON-RESONANT ELECTRON SPIN RESONANT PROBE AND ASSOCIATED HARDWARE
Publication number
20200003909
Publication date
Jan 2, 2020
Global Resonance Technologies, LLC
Jason Campbell
G01 - MEASURING TESTING
Information
Patent Application
PHASE SHIFT DETECTOR PROCESS FOR MAKING AND USE OF SAME
Publication number
20160209275
Publication date
Jul 21, 2016
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
KIN P. CHEUNG
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON SPIN RESONANCE SPECTROMETER AND METHOD FOR USING SAME
Publication number
20140210473
Publication date
Jul 31, 2014
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
JASON P. CAMPBELL
G01 - MEASURING TESTING