TREA

Jason W. Farris

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  • Parkville, MO, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Interconnect system
    • Patent number 8,575,953
    • Issue date Nov 5, 2013
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable test socket
    • Patent number 8,062,039
    • Issue date Nov 22, 2011
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable test socket
    • Patent number 7,581,962
    • Issue date Sep 1, 2009
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Eccentric offset Kelvin probe
    • Patent number 7,298,153
    • Issue date Nov 20, 2007
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Interconnect System
    • Publication number 20110312229
    • Publication date Dec 22, 2011
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERCONNECT SYSTEM
    • Publication number 20090289647
    • Publication date Nov 26, 2009
    • INTERCONNECT DEVICES, INC.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE TEST SOCKET
    • Publication number 20090227125
    • Publication date Sep 10, 2009
    • INTERCONNECT DEVICES, INC.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Adjustable test socket
    • Publication number 20070285106
    • Publication date Dec 13, 2007
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    Eccentric offset Kelvin probe
    • Publication number 20060267601
    • Publication date Nov 30, 2006
    • Jason W. Farris
    • G01 - MEASURING TESTING