Jason W. McNichols

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer edge defect inspection using captured image analysis
- Patent number 7,968,859
- Issue date Jun 28, 2011
- LSI Corporation
- Roger Y. B. Young
- G01 - MEASURING TESTING
Information Patent Grant
Surface coordinate system
- Patent number 7,315,360
- Issue date Jan 1, 2008
- LSI Logic Corporation
- Bruce J. Whitefield
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge structure measurement method
- Patent number 7,312,880
- Issue date Dec 25, 2007
- LSI Corporation
- Bruce Whitefield
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface coordinate system
- Publication number 20060073617
- Publication date Apr 6, 2006
- Bruce J. Whitefield
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge structure measurement method
- Publication number 20060044571
- Publication date Mar 2, 2006
- Bruce Whitefield
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge defect inspection
- Publication number 20050023491
- Publication date Feb 3, 2005
- Roger Y. B. Young
- G01 - MEASURING TESTING