Jason Zse-Cherng Lin

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methodology of incorporating wafer physical measurement with digita...
- Patent number 11,120,182
- Issue date Sep 14, 2021
- Applied Materials, Inc.
- Jason Zse-cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto defect screening using adaptive machine learning in semiconduc...
- Patent number 10,754,309
- Issue date Aug 25, 2020
- Applied Materials, Inc.
- Jason Zse-Cherng Lin
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Auto defect screening using adaptive machine learning in semiconduc...
- Patent number 10,365,617
- Issue date Jul 30, 2019
- DMO Systems Limited
- Jason Zse-Cherng Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for mixed mode wafer inspection
- Patent number 10,192,303
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of defects embedded in noise for inspection in semiconduc...
- Patent number 9,916,653
- Issue date Mar 13, 2018
- KLA-Tenor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for discovering unknown problematic patterns in c...
- Patent number 9,547,745
- Issue date Jan 17, 2017
- DMO Systems Limited
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for identifying systematic defects in wafer inspe...
- Patent number 9,142,014
- Issue date Sep 22, 2015
- DMO Systems Limited
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signature analytics for improving lithographic process of manufactu...
- Patent number 8,938,695
- Issue date Jan 20, 2015
- DMO Systems Limited
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for simultaneously inspecting multiple array...
- Patent number 8,692,878
- Issue date Apr 8, 2014
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Status polling
- Patent number 8,645,100
- Issue date Feb 4, 2014
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Memory cell and page break inspection
- Patent number 8,155,428
- Issue date Apr 10, 2012
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for generating information to be used for selec...
- Patent number 8,000,922
- Issue date Aug 16, 2011
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Memory load balancing
- Patent number 7,865,037
- Issue date Jan 4, 2011
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G01 - MEASURING TESTING
Information Patent Grant
Mirror node process verification
- Patent number 7,602,958
- Issue date Oct 13, 2009
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for binning defects detected on a specimen
- Patent number 7,570,800
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Daisy chained topology
- Patent number 7,555,409
- Issue date Jun 30, 2009
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image data storage
- Patent number 7,440,640
- Issue date Oct 21, 2008
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Outlier substrate inspection
- Patent number 7,440,607
- Issue date Oct 21, 2008
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable image computer
- Patent number 7,379,838
- Issue date May 27, 2008
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Full swath analysis
- Patent number 7,251,586
- Issue date Jul 31, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and apparatus for the inspection of either random...
- Patent number 7,218,768
- Issue date May 15, 2007
- KLA-Tencor Technologies Corporation
- David M. W. Evans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Status polling
- Patent number 7,181,368
- Issue date Feb 20, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Programmable image computer
- Patent number 7,149,642
- Issue date Dec 12, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory load balancing
- Patent number 7,076,390
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Full swath analysis
- Patent number 7,024,339
- Issue date Apr 4, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for optically detecting defects in voltage co...
- Patent number 6,774,648
- Issue date Aug 10, 2004
- KLA-Tencor Technologies Corporation
- Jason C. H. Lin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus for the inspection of either random...
- Patent number 6,665,432
- Issue date Dec 16, 2003
- David M. W. Evans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for analyzing topological features on a surface
- Patent number 6,137,570
- Issue date Oct 24, 2000
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus for the inspection of either random...
- Patent number 6,021,214
- Issue date Feb 1, 2000
- KLA Instruments Corp.
- David M. W. Evans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and apparatus for the inspection of either random...
- Patent number 5,537,669
- Issue date Jul 16, 1996
- KLA Instruments Corporation
- David M. W. Evans
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODOLOGY OF INCORPORATING WAFER PHYSICAL MEASUREMENT WITH DIGITA...
- Publication number 20190384882
- Publication date Dec 19, 2019
- Applied Materials, Inc.
- Jason Zse-cherng LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...
- Publication number 20190384236
- Publication date Dec 19, 2019
- Applied Materials, Inc.
- Jason Zse-Cherng LIN
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20190108630
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...
- Publication number 20180164792
- Publication date Jun 14, 2018
- DMO SYSTEMS LIMITED
- Jason Zse-Cherng Lin
- G05 - CONTROLLING REGULATING
Information Patent Application
System And Method For Discovering Unknown Problematic Patterns In C...
- Publication number 20170032075
- Publication date Feb 2, 2017
- DMO SYSTEMS LIMITED
- Shauh-Teh Juang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology Of Incorporating Wafer Physical Measurement With Digita...
- Publication number 20160217240
- Publication date Jul 28, 2016
- DMO SYSTEMS LIMITED
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING SYSTEMATIC DEFECTS IN WAFER INSPE...
- Publication number 20140355867
- Publication date Dec 4, 2014
- Jason Zse-Cherng Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus For Design-Based Manufacturing Optimization In Semiconduc...
- Publication number 20140214192
- Publication date Jul 31, 2014
- DMO SYSTEMS LIMITED
- Shauh-Teh Juang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20140153814
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF DEFECTS EMBEDDED IN NOISE FOR INSPECTION IN SEMICONDUC...
- Publication number 20140002632
- Publication date Jan 2, 2014
- Jason Z. LIN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR SIMULTANEOUSLY INSPECTING MULTIPLE ARRAY...
- Publication number 20110164130
- Publication date Jul 7, 2011
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...
- Publication number 20090299681
- Publication date Dec 3, 2009
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
- Publication number 20090290784
- Publication date Nov 26, 2009
- KLA-Tencor Technologies Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory cell and page break inspection
- Publication number 20090067722
- Publication date Mar 12, 2009
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory cell and page break inspection
- Publication number 20090067703
- Publication date Mar 12, 2009
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for binning defects detected on a specimen
- Publication number 20070133860
- Publication date Jun 14, 2007
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Status Polling
- Publication number 20070124095
- Publication date May 31, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Application
Programmable Image Computer
- Publication number 20070005284
- Publication date Jan 4, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Full swath analysis
- Publication number 20060106580
- Publication date May 18, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method and apparatus for the inspection of either random...
- Publication number 20040202361
- Publication date Oct 14, 2004
- David M.W. Evans
- G06 - COMPUTING CALCULATING COUNTING

Jason Zse-Cherng Lin

Person

Patents Grantslast 30 patents

Methodology of incorporating wafer physical measurement with digita...

Auto defect screening using adaptive machine learning in semiconduc...

Auto defect screening using adaptive machine learning in semiconduc...

Method and system for mixed mode wafer inspection

Detection of defects embedded in noise for inspection in semiconduc...

System and method for discovering unknown problematic patterns in c...

System and method for identifying systematic defects in wafer inspe...

Signature analytics for improving lithographic process of manufactu...

Methods and apparatus for simultaneously inspecting multiple array...

Status polling

Memory cell and page break inspection

Methods and systems for generating information to be used for selec...

Memory load balancing

Mirror node process verification

Methods and systems for binning defects detected on a specimen

Daisy chained topology

Image data storage

Outlier substrate inspection

Programmable image computer

Full swath analysis

Inspection method and apparatus for the inspection of either random...

Status polling

Programmable image computer

Memory load balancing

Full swath analysis

Apparatus and methods for optically detecting defects in voltage co...

Inspection method and apparatus for the inspection of either random...

System and method for analyzing topological features on a surface

Inspection method and apparatus for the inspection of either random...

Inspection method and apparatus for the inspection of either random...

Patents Applicationslast 30 patents

METHODOLOGY OF INCORPORATING WAFER PHYSICAL MEASUREMENT WITH DIGITA...

AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...

Method and System for Mixed Mode Wafer Inspection

AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...

System And Method For Discovering Unknown Problematic Patterns In C...

Methodology Of Incorporating Wafer Physical Measurement With Digita...

SYSTEM AND METHOD FOR IDENTIFYING SYSTEMATIC DEFECTS IN WAFER INSPE...

Apparatus For Design-Based Manufacturing Optimization In Semiconduc...

Method and System for Mixed Mode Wafer Inspection

DETECTION OF DEFECTS EMBEDDED IN NOISE FOR INSPECTION IN SEMICONDUC...

METHODS AND APPARATUS FOR SIMULTANEOUSLY INSPECTING MULTIPLE ARRAY...

METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...

METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN

Memory cell and page break inspection

Memory cell and page break inspection

Methods and systems for binning defects detected on a specimen

Status Polling

Programmable Image Computer

Full swath analysis

Inspection method and apparatus for the inspection of either random...