Jasper Frans Mathijs van Rens

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Hegelsom, NL

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Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight charged particle spectroscopy
- Patent number 9,984,852
- Issue date May 29, 2018
- FEI Company
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240297013
- Publication date Sep 5, 2024
- ASML NETHERLANDS B.V.
- Jasper Frans Mathijs VAN RENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM IMAGE ENHANCEMENT
- Publication number 20240212108
- Publication date Jun 27, 2024
- ASML NETHERLANDS B.V.
- Thomas Jarik HUISMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...
- Publication number 20230335374
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DELAY TIME MEASUREMENT METHOD AND SYSTEM
- Publication number 20230298852
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT CHARGED PARTICLE SPECTROSCOPY
- Publication number 20180151329
- Publication date May 31, 2018
- FEI Company
- Otger Jom Luiten
- H01 - BASIC ELECTRIC ELEMENTS