Jasper Goh

Follow

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-variable regression for metrology
- Patent number 7,966,142
- Issue date Jun 21, 2011
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Wen Zhan Zhou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-VARIABLE REGRESSION FOR METROLOGY
- Publication number 20090258445
- Publication date Oct 15, 2009
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Wen Zhan ZHOU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SYSTEM EMPLOYING FEED-FORWARD CONTROL
- Publication number 20090179307
- Publication date Jul 16, 2009
- Chartered Semiconductor Manufacturing LTD.
- Wenzhan Zhou
- H01 - BASIC ELECTRIC ELEMENTS