Jatinder Dhaliwal

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Low contrast non-referential defect detection
- Patent number 12,354,254
- Issue date Jul 8, 2025
- Onto Innovation Inc.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 10,024,804
- Issue date Jul 17, 2018
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 9,658,169
- Issue date May 23, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PERIODIC-PATTERN BACKGROUND REMOVAL
- Publication number 20240020819
- Publication date Jan 18, 2024
- ONTO INNOVATION INC.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW CONTRAST NON-REFERENTIAL DEFECT DETECTION
- Publication number 20230012917
- Publication date Jan 19, 2023
- ONTO INNOVATION INC.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20170254757
- Publication date Sep 7, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20150316487
- Publication date Nov 5, 2015
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20140320635
- Publication date Oct 30, 2014
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING