Javier A. Ayala

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Silicided device with shallow impurity regions at interface between...
- Patent number 8,592,308
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Javier Ayala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated dynamic metrology sampling system and method for process...
- Patent number 7,881,891
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Javier A. Ayala
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated dynamic metrology sampling system and method for process...
- Patent number 7,487,054
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Javier A. Ayala
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FORMING A V-GROOVE FOR A FIBER OPTICS CABLE ON AN INTEGR...
- Publication number 20210278611
- Publication date Sep 9, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Asli Sahin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDED DEVICE WITH SHALLOW IMPURITY REGIONS AT INTERFACE BETWEEN...
- Publication number 20130020616
- Publication date Jan 24, 2013
- International Business Machines Corporation
- Javier Ayala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED DYNAMIC METROLOGY SAMPLING SYSTEM AND METHOD FOR PROCESS...
- Publication number 20090119049
- Publication date May 7, 2009
- Javier A. Ayala
- G05 - CONTROLLING REGULATING
Information Patent Application
AUTOMATED DYNAMIC METROLOGY SAMPLING SYSTEM ADN METHOD FOR PROCESS...
- Publication number 20060259279
- Publication date Nov 16, 2006
- International Business Machines Corporation
- Javier A. Ayala
- G05 - CONTROLLING REGULATING