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Javier E. Satulovsky
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method of data-dependent acquisition by mass spectrometry
Patent number
11,646,185
Issue date
May 9, 2023
Agilent Technologies, Inc.
Javier E. Satulovsky
G01 - MEASURING TESTING
Information
Patent Grant
System and method of data-dependent acquisition by mass spectrometry
Patent number
10,553,412
Issue date
Feb 4, 2020
Agilent Technologies, Inc.
Javier E. Satulovsky
G01 - MEASURING TESTING
Information
Patent Grant
Method for isomer discrimination by tandem mass spectrometry
Patent number
9,530,633
Issue date
Dec 27, 2016
Agilent Technologies, Inc.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility mass spectrometry tags for quantitative applications a...
Patent number
9,377,468
Issue date
Jun 28, 2016
Agilent Technologies, Inc.
Brian Phillip Smart
G01 - MEASURING TESTING
Information
Patent Grant
System and method for performing tandem mass spectrometry analysis
Patent number
8,987,662
Issue date
Mar 24, 2015
Agilent Technologies, Inc.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated baseline removal of signal
Patent number
8,645,090
Issue date
Feb 4, 2014
Agilent Technologies, Inc.
Javier E. Satulovsky
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD OF DATA-DEPENDENT ACQUISITION BY MASS SPECTROMETRY
Publication number
20200144040
Publication date
May 7, 2020
Javier E. Satulovsky
G01 - MEASURING TESTING
Information
Patent Application
ION MOBILITY MASS SPECTROMETRY TAGS FOR QUANTITATIVE APPLICATIONS A...
Publication number
20140273252
Publication date
Sep 18, 2014
AGILENT TECHNOLOGIES, INC.
Brian Phillip Smart
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ISOMER DISCRIMINATION BY TANDEM MASS SPECTROMETRY
Publication number
20110295521
Publication date
Dec 1, 2011
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD OF DATA-DEPENDENT ACQUISITION BY MASS SPECTROMETRY
Publication number
20110288779
Publication date
Nov 24, 2011
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and method for analyzing contents of sample based on quality...
Publication number
20100288917
Publication date
Nov 18, 2010
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and method for performing tandem mass spectrometry analysis
Publication number
20100288918
Publication date
Nov 18, 2010
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Automated baseline removal of signal
Publication number
20100292957
Publication date
Nov 18, 2010
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Data Dependent Acquisition System for Mass Spectrometry and Methods...
Publication number
20100286927
Publication date
Nov 11, 2010
AGILENT TECHNOLOGIES, INC.
David Maron Horn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detecting peaks in two-dimensional signals
Publication number
20100283785
Publication date
Nov 11, 2010
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
G06 - COMPUTING CALCULATING COUNTING