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Jay BURDETT
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Scotia, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Sample handling apparatus for pressurized fluids and X-ray analyzer...
Patent number
10,705,033
Issue date
Jul 7, 2020
X-Ray Optical Systems, Inc.
Joseph J Spinazola
G01 - MEASURING TESTING
Information
Patent Grant
Sample module with sample stream supported and spaced from window,...
Patent number
8,625,737
Issue date
Jan 7, 2014
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER...
Publication number
20190056337
Publication date
Feb 21, 2019
X-Ray Optical Systems, Inc.
Joseph J SPINAZOLA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MODULE WITH SAMPLE STREAM SUPPORTED AND SPACED FROM WINDOW,...
Publication number
20110194671
Publication date
Aug 11, 2011
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING