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Jay Ormsby
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Salem, MA, US
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last 30 patents
Information
Patent Grant
High sensitivity optical inspection system and method for detecting...
Patent number
6,603,542
Issue date
Aug 5, 2003
QC Optics, Inc.
Eric Chase
G01 - MEASURING TESTING
Information
Patent Grant
Multistation surface inspection system
Patent number
5,814,829
Issue date
Sep 29, 1998
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Pellicle reflectivity monitoring system having means for compensati...
Patent number
5,717,198
Issue date
Feb 10, 1998
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Plate holder for a surface inspection system
Patent number
5,675,409
Issue date
Oct 7, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Surface displacement detection and adjustment system
Patent number
5,672,885
Issue date
Sep 30, 1997
QC Optics, Inc.
Nicholas Allen
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection system and method for detecting flaws on a diffr...
Patent number
5,625,193
Issue date
Apr 29, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection system
Patent number
5,610,719
Issue date
Mar 11, 1997
QC Optics, Inc.
Nicholas Allen
G01 - MEASURING TESTING
Information
Patent Grant
Data processing system and method for a surface inspection apparatus
Patent number
5,602,401
Issue date
Feb 11, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Surface pit and mound detection and discrimination system and method
Patent number
5,389,794
Issue date
Feb 14, 1995
QC Optics, Inc.
Nicholas C. Allen
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and method for detecting flaws on a diffractiv...
Patent number
4,943,734
Issue date
Jul 24, 1990
QC Optics, Inc.
Carl E. A. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Surface pit detection system and method
Patent number
4,794,265
Issue date
Dec 27, 1988
QC Optics, Inc.
George S. Quackenbos
G01 - MEASURING TESTING
Information
Patent Grant
Surface defect detection and confirmation system and method
Patent number
4,794,264
Issue date
Dec 27, 1988
QC Optics, Inc.
George S. Quackenbos
G01 - MEASURING TESTING