Jay Shah

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Ahmedabad, IN

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Patents Grantslast 30 patents

Information Patent Grant
Programmable scan compression
- Patent number 11,275,112
- Issue date Mar 15, 2022
- Seagate Technology LLC
- Bharat P. Londhe
- G01 - MEASURING TESTING
Information Patent Grant
Programmable scan shift testing
- Patent number 10,921,371
- Issue date Feb 16, 2021
- Seagate Technology LLC
- Jay Shah
- G01 - MEASURING TESTING
Information Patent Grant
Rapid scan testing of integrated circuit chips
- Patent number 10,921,372
- Issue date Feb 16, 2021
- Seagate Technology LLC
- Rajesh Maruti Bhagwat
- G01 - MEASURING TESTING
Information Patent Grant
Programmable scan compression
- Patent number 10,775,432
- Issue date Sep 15, 2020
- Seagate Technology LLC
- Bharat P. Londhe
- G01 - MEASURING TESTING
Information Patent Grant
Circuit including efficient clocking for testing memory interface
- Patent number 10,685,730
- Issue date Jun 16, 2020
- Seagate Technology LLC
- Komal Shah
- G11 - INFORMATION STORAGE
Information Patent Grant
Rapid scan testing of integrated circuit chips
- Patent number 10,353,001
- Issue date Jul 16, 2019
- Seagate Technology LLC
- Rajesh Maruti Bhagwat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE SCAN COMPRESSION
- Publication number 20210072311
- Publication date Mar 11, 2021
- SEAGATE TECHNOLOGY LLC
- Bharat P. Londhe
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE SCAN COMPRESSION
- Publication number 20190369162
- Publication date Dec 5, 2019
- SEAGATE TECHNOLOGY LLC
- Bharat P. Londhe
- G01 - MEASURING TESTING
Information Patent Application
RAPID SCAN TESTING OF INTEGRATED CIRCUIT CHIPS
- Publication number 20190339326
- Publication date Nov 7, 2019
- SEAGATE TECHNOLOGY LLC
- Rajesh Maruti Bhagwat
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE SCAN SHIFT TESTING
- Publication number 20190011500
- Publication date Jan 10, 2019
- SEAGATE TECHNOLOGY LLC
- Jay Shah
- G01 - MEASURING TESTING
Information Patent Application
RAPID SCAN TESTING OF INTEGRATED CIRCUIT CHIPS
- Publication number 20180348298
- Publication date Dec 6, 2018
- SEAGATE TECHNOLOGY LLC
- Rajesh Maruti Bhagwat
- G01 - MEASURING TESTING