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Jay Weitzen
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Chelmsford, MA, US
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last 30 patents
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Patent Grant
Position location system and method
Patent number
6,259,404
Issue date
Jul 10, 2001
Signatron Technology Corporation
Steen A. Parl
G01 - MEASURING TESTING
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Patent Grant
Position location system and method
Patent number
5,883,598
Issue date
Mar 16, 1999
Signatron Technology Corporation
Steen A. Parl
G01 - MEASURING TESTING