Jayasanker Jayabalan

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Singapore, SG

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Patents Applicationslast 30 patents

Information Patent Application
Compliant probes and test methodology for fine pitch wafer level de...
- Publication number 20070040565
- Publication date Feb 22, 2007
- National University of Singapore, Agency For Science, Technology and Research
- Jayasanker Jayabalan
- G01 - MEASURING TESTING