Jaydeep Sinha

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Norwood, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer gripping fingers to minimize distortion
- Patent number 7,175,214
- Issue date Feb 13, 2007
- ADE Corporation
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen topography reconstruction
- Patent number 7,136,519
- Issue date Nov 14, 2006
- ADE Corporation
- Jaydeep Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ring chuck to hold 200 and 300 mm wafer
- Patent number 6,954,269
- Issue date Oct 11, 2005
- ADE Corporation
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer shape accuracy using symmetric and asymmetric instrument erro...
- Patent number 6,594,002
- Issue date Jul 15, 2003
- ADE Corporation
- William Drohan
- G01 - MEASURING TESTING
Information Patent Grant
Ring chuck to hold 200 and 300 mm wafer
- Patent number 6,538,733
- Issue date Mar 25, 2003
- ADE Corporation
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Wafer gripping fingers to minimize distortion
- Publication number 20050029823
- Publication date Feb 10, 2005
- ADE CORPORATION
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ring chuck to hold 200 and 300 MM wafer
- Publication number 20030142300
- Publication date Jul 31, 2003
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen topography reconstruction
- Publication number 20020177980
- Publication date Nov 28, 2002
- Jaydeep Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ring chuck to hold 200 and 300 mm wafer
- Publication number 20020024174
- Publication date Feb 28, 2002
- ADE CORPORATION
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shape accuracy improvement using a novel calibration approach
- Publication number 20020017911
- Publication date Feb 14, 2002
- William Drohan
- G01 - MEASURING TESTING