Jayhoon CHUNG

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated termination for multiple trench field plate
- Patent number 9,673,317
- Issue date Jun 6, 2017
- Texas Instruments Incorporated
- Hideaki Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated termination for multiple trench field plate
- Patent number 9,450,082
- Issue date Sep 20, 2016
- Texas Instruments Incorporated
- Hideaki Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strain measurement test module
- Patent number 8,853,805
- Issue date Oct 7, 2014
- Texas Instruments Incorporated
- Jayhoon Chung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED TERMINATION FOR MULTIPLE TRENCH FIELD PLATE
- Publication number 20160359039
- Publication date Dec 8, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Hideaki KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED TERMINATION FOR MULTIPLE TRENCH FIELD PLATE
- Publication number 20150357461
- Publication date Dec 10, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Hideaki KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAIN MEASUREMENT TEST MODULE
- Publication number 20120325009
- Publication date Dec 27, 2012
- TEXAS INSTRUMENTS
- Jayhoon CHUNG
- G01 - MEASURING TESTING
Information Patent Application
REPRODUCIBLE LATTICE STRAIN MEASUREMENT METHOD
- Publication number 20110084209
- Publication date Apr 14, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Jayhoon CHUNG
- G01 - MEASURING TESTING