J.E. Patrick Gagnon

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Plano, TX, US

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Patents Applicationslast 30 patents

Information Patent Application
System and method for analyzing a light beam of an exposure tool or...
- Publication number 20080055590
- Publication date Mar 6, 2008
- TEXAS INSTRUMENTS INCORPORATED
- J.E. Patrick Gagnon
- G01 - MEASURING TESTING
Information Patent Application
System and method for analyzing a light beam of a wafer inspection...
- Publication number 20080056557
- Publication date Mar 6, 2008
- TEXAS INSTRUMENTS INCORPORATED
- J.E. Patrick Gagnon
- G01 - MEASURING TESTING