Jea-Muk Oh

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Asan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 10,823,779
- Issue date Nov 3, 2020
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 9,995,787
- Issue date Jun 12, 2018
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for manufacturing substrates
- Patent number 9,285,416
- Issue date Mar 15, 2016
- Samsung Electronics Co., Ltd.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Test handler that rapidly transforms temperature and method of test...
- Patent number 9,207,272
- Issue date Dec 8, 2015
- Samsung Eletronics Co., Ltd.
- Jea-Muk Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20180246164
- Publication date Aug 30, 2018
- SEMES CO., LTD.
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20160154054
- Publication date Jun 2, 2016
- Youngchul Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER THAT RAPIDLY TRANSFORMS TEMPERATURE AND METHOD OF TEST...
- Publication number 20140077829
- Publication date Mar 20, 2014
- Samsung Electronics Co., Ltd.
- Jea-Muk OH
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
- Publication number 20130257471
- Publication date Oct 3, 2013
- Youngchul Lee
- G01 - MEASURING TESTING