Jean-Fran.cedilla.ois Cote

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Aylmer, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for scan testing digital circuits
- Patent number 6,145,105
- Issue date Nov 7, 2000
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Clock skew management method and apparatus
- Patent number 6,115,827
- Issue date Sep 5, 2000
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing multi-port memory using shadow read
- Patent number 6,046,946
- Issue date Apr 4, 2000
- Logic Visions, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE