Jean-François Côté

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Patents Grantslast 30 patents

Information Patent Grant
Asynchronous interface for transporting test-related data via seria...
- Patent number 11,789,487
- Issue date Oct 17, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Benoit Nadeau-Dostie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-capture at-speed scan test based on a slow clock signal
- Patent number 11,614,487
- Issue date Mar 28, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Grant
Clock gating and scan clock generation for circuit test
- Patent number 11,085,965
- Issue date Aug 10, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Grant
Local clock injection and independent capture for circuit test of m...
- Patent number 11,042,181
- Issue date Jun 22, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Jean-Francois Cote
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
High Bandwidth IJTAG Through High Speed Parallel Bus
- Publication number 20230297534
- Publication date Sep 21, 2023
- Siemens Industry Software Inc.
- Jean-Francois Cote
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYNCHRONOUS INTERFACE FOR TRANSPORTING TEST-RELATED DATA VIA SERIA...
- Publication number 20230110161
- Publication date Apr 13, 2023
- Siemens Industry Software Inc.
- Benoit Nadeau-Dostie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CAPTURE AT-SPEED SCAN TEST BASED ON A SLOW CLOCK SIGNAL
- Publication number 20220018902
- Publication date Jan 20, 2022
- Siemens Industry Software Inc.
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Application
Local Clock Injection And Independent Capture For Circuit Test Of M...
- Publication number 20200142442
- Publication date May 7, 2020
- Mentor Graphics Corporation
- Jean-Francois Cote
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clock Gating And Scan Clock Generation For Circuit Test
- Publication number 20200141999
- Publication date May 7, 2020
- Mentor Graphics Corporation
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Application
Methods For At-Speed Testing Of Memory Interface
- Publication number 20120198294
- Publication date Aug 2, 2012
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE