Jean-Luc Rouviere

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Meylan, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining the deflection of an electron beam resulting...
- Patent number 10,593,511
- Issue date Mar 17, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benedikt Haas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING THE DEFLECTION OF AN ELECTRON BEAM RESULTING...
- Publication number 20180076005
- Publication date Mar 15, 2018
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Benedikt HAAS
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO FACILITATE POSITIONING OF DIFFRACTION SPOTS
- Publication number 20130206968
- Publication date Aug 15, 2013
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jean-Luc Rouviere
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring physical parameters of at least one micrometri...
- Publication number 20060288797
- Publication date Dec 28, 2006
- Jean-Luc Rouviere
- G01 - MEASURING TESTING