Jean-Luc Truche

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for surface desorption ionization by charged p...
- Patent number 8,129,677
- Issue date Mar 6, 2012
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion calibrant introduction
- Patent number 7,855,357
- Issue date Dec 21, 2010
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface desorption ionization by charged p...
- Patent number 7,723,678
- Issue date May 25, 2010
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MALDI sample plate imaging workstation
- Patent number 7,495,231
- Issue date Feb 24, 2009
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source sample plate illumination system
- Patent number 7,435,951
- Issue date Oct 14, 2008
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curved conduit ion sampling device and method
- Patent number 7,423,261
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for combined laser focusing and spot imaging for MALDI
- Patent number 7,423,260
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Gregor Overney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,372,043
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increased depth of field for high resolution imaging for a matrix-b...
- Patent number 7,365,310
- Issue date Apr 29, 2008
- Agilent Technologies, Inc.
- Jean-Luc Truche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser alignment for ion source
- Patent number 7,262,841
- Issue date Aug 28, 2007
- Agilent Technologies, Inc.
- Jean-Luc Truche
- G01 - MEASURING TESTING
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 7,205,536
- Issue date Apr 17, 2007
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compensating for a measured variation in length of a flight tube of...
- Patent number 7,183,543
- Issue date Feb 27, 2007
- Agilent Technologies, Inc.
- Gregor Overney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,135,689
- Issue date Nov 14, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,132,670
- Issue date Nov 7, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 7,115,860
- Issue date Oct 3, 2006
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,091,482
- Issue date Aug 15, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,078,682
- Issue date Jul 18, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 6,967,324
- Issue date Nov 22, 2005
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target support and method for ion production enhancement
- Patent number 6,858,841
- Issue date Feb 22, 2005
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 6,825,462
- Issue date Nov 30, 2004
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Matrix-assisted laser desorption/ionization sample holders and meth...
- Patent number 6,822,230
- Issue date Nov 23, 2004
- Agilent Technologies, Inc.
- Arthur Schleifer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
AP-MALDI target illumination device and method for using an AP-MALD...
- Patent number 6,707,039
- Issue date Mar 16, 2004
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro matrix ion generator for analyzers
- Patent number 6,627,880
- Issue date Sep 30, 2003
- Agilent Technologies, Inc.
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Universal quadrupole and method of manufacture
- Patent number 5,616,919
- Issue date Apr 1, 1997
- Hewlett-Packard Company
- Carolyn C. Broadbent
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Universal quadrupole and method of manufacture
- Patent number 5,525,084
- Issue date Jun 11, 1996
- Hewlett-Packard Company
- Carolyn C. Broadbent
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow-limited direct GC/MS interface
- Patent number 4,662,914
- Issue date May 5, 1987
- Hewlett-Packard Company
- Stuart C. Hansen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Surface Desorption Ionization by Charged P...
- Publication number 20100230589
- Publication date Sep 16, 2010
- AGILENT TECHNOLOGIES, INC.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Curved conduit ion sampling device and method
- Publication number 20070235642
- Publication date Oct 11, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for surface desorption ionization by charged p...
- Publication number 20070228271
- Publication date Oct 4, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion calibrant introduction
- Publication number 20070164231
- Publication date Jul 19, 2007
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for mass spectrometer diagnostics
- Publication number 20070164205
- Publication date Jul 19, 2007
- Jean Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for combined laser focusing and spot imaging for MALDI
- Publication number 20070102632
- Publication date May 10, 2007
- Gregor Overney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Maldi sample plate imaging workstation
- Publication number 20070051899
- Publication date Mar 8, 2007
- Jean-Luc Truche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method for ion capture and production
- Publication number 20070001114
- Publication date Jan 4, 2007
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Increased depth of field for high resolution imaging for a matrix-b...
- Publication number 20060289734
- Publication date Dec 28, 2006
- Jean-Luc Truche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ion source sample plate illumination system
- Publication number 20060278824
- Publication date Dec 14, 2006
- Jean-Luc Truche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Laser alignment for ion source
- Publication number 20060207115
- Publication date Sep 21, 2006
- Jean-Luc Truche
- G01 - MEASURING TESTING
Information Patent Application
Patterned nanostructure sample supports for mass spectrometry and m...
- Publication number 20060180755
- Publication date Aug 17, 2006
- Ying-Lan Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050274905
- Publication date Dec 15, 2005
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050161613
- Publication date Jul 28, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050151090
- Publication date Jul 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050151091
- Publication date Jul 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20050139765
- Publication date Jun 30, 2005
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20050139766
- Publication date Jun 30, 2005
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Target support and method for ion production enhancement
- Publication number 20050098722
- Publication date May 12, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050077464
- Publication date Apr 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050072918
- Publication date Apr 7, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for surface activation and selective ion gener...
- Publication number 20040217277
- Publication date Nov 4, 2004
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATRIX-ASSISTED LASER DESORPTION/IONIZATION SAMPLE HOLDERS AND METH...
- Publication number 20040119013
- Publication date Jun 24, 2004
- Arthur Schleifer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AP-MALDI TARGET ILLUMINATION DEVICE AND METHOD FOR USING AN AP-MALD...
- Publication number 20040056192
- Publication date Mar 25, 2004
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20040036019
- Publication date Feb 26, 2004
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Target support and method for ion production enhancement
- Publication number 20030160167
- Publication date Aug 28, 2003
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20030160165
- Publication date Aug 28, 2003
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro matrix ion generator for analyzers
- Publication number 20030102437
- Publication date Jun 5, 2003
- Paul C. Goodley
- H01 - BASIC ELECTRIC ELEMENTS

Jean-Luc Truche

Person

Patents Grantslast 30 patents

Method and apparatus for surface desorption ionization by charged p...

Apparatus and method for ion calibrant introduction

Method and apparatus for surface desorption ionization by charged p...

MALDI sample plate imaging workstation

Ion source sample plate illumination system

Curved conduit ion sampling device and method

Apparatus for combined laser focusing and spot imaging for MALDI

Apparatus and method for ion production enhancement

Increased depth of field for high resolution imaging for a matrix-b...

Laser alignment for ion source

Micro matrix ion generator for analyzers

Compensating for a measured variation in length of a flight tube of...

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Micro matrix ion generator for analyzers

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Micro matrix ion generator for analyzers

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement

Matrix-assisted laser desorption/ionization sample holders and meth...

AP-MALDI target illumination device and method for using an AP-MALD...

Micro matrix ion generator for analyzers

Universal quadrupole and method of manufacture

Universal quadrupole and method of manufacture

Flow-limited direct GC/MS interface

Patents Applicationslast 30 patents

Method and Apparatus for Surface Desorption Ionization by Charged P...

Curved conduit ion sampling device and method

Method and apparatus for surface desorption ionization by charged p...

Apparatus and method for ion calibrant introduction

Method and apparatus for mass spectrometer diagnostics

Apparatus for combined laser focusing and spot imaging for MALDI

Maldi sample plate imaging workstation

Apparatus and method for ion capture and production

Increased depth of field for high resolution imaging for a matrix-b...

Ion source sample plate illumination system

Laser alignment for ion source

Patterned nanostructure sample supports for mass spectrometry and m...

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Micro matrix ion generator for analyzers

Micro matrix ion generator for analyzers

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for surface activation and selective ion gener...

MATRIX-ASSISTED LASER DESORPTION/IONIZATION SAMPLE HOLDERS AND METH...

AP-MALDI TARGET ILLUMINATION DEVICE AND METHOD FOR USING AN AP-MALD...

Micro matrix ion generator for analyzers

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement

Micro matrix ion generator for analyzers