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Paris, FR
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last 30 patents
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Patent Grant
Method and apparatus for selective suppression of portions of an ec...
Patent number
4,922,422
Issue date
May 1, 1990
U.S. Philips Corporation
Jean Pergrale
G01 - MEASURING TESTING
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Patent Grant
Gamma camera comprising a localizing scintillation intensifier
Patent number
4,438,334
Issue date
Mar 20, 1984
U.S. Philips Corporation
Michel Jatteau
G01 - MEASURING TESTING
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Patent Grant
Gamma camera
Patent number
4,284,891
Issue date
Aug 18, 1981
U.S. Philips Corporation
Jean Pergrale
G01 - MEASURING TESTING