Jean-Pierre Agnes Henricus Marie Vaessen

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Veldhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring a parameter of interest, inspection apparatus,...
- Patent number 10,705,430
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic system and device man...
- Patent number 10,132,763
- Issue date Nov 20, 2018
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of metrology, inspection apparatus, lithographic system and...
- Patent number 9,958,789
- Issue date May 1, 2018
- ASML Netherlands B.V.
- Peter Hanzen Wardenier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING A PARAMETER OF INTEREST, INSPECTION APPARATUS,...
- Publication number 20180341182
- Publication date Nov 29, 2018
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Metrology, Inspection Apparatus, Lithographic System and...
- Publication number 20160370710
- Publication date Dec 22, 2016
- ASML NETHERLANDS B.V.
- Peter Hanzen WARDENIER
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Apparatus, Lithographic System and Device Man...
- Publication number 20150177166
- Publication date Jun 25, 2015
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING