Jean-Pierre Rey

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Fontenay aux Roses, FR

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Patents Grantslast 30 patents

Information Patent Grant
Compact spectroscopic ellipsometer
- Patent number 7,230,701
- Issue date Jun 12, 2007
- Societe de Production et de Recherches Appliquees
- Jean-Louis Stehle
- G01 - MEASURING TESTING
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,608,526
- Issue date Mar 4, 1997
- Tencor Instruments
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Focused beam spectroscopic ellipsometry method and system
- Publication number 20040100632
- Publication date May 27, 2004
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Application
Compact spectroscopic ellipsometer
- Publication number 20040070760
- Publication date Apr 15, 2004
- Jean-Louis Stehle
- G01 - MEASURING TESTING