Jeanne P. Spence Bickford

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method to predict chip IDDQ and control leakage components
- Patent number 9,117,045
- Issue date Aug 25, 2015
- International Business Machines Coporation
- Jeanne P. Spence Bickford
- G01 - MEASURING TESTING
Information Patent Grant
System and method to optimize semiconductor power by integration of...
- Patent number 7,877,714
- Issue date Jan 25, 2011
- International Business Machines Corporation
- Theodoros E. Anemikos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD TO OPTIMIZE SEMICONDUCTOR POWER BY INTEGRATION OF...
- Publication number 20090217221
- Publication date Aug 27, 2009
- International Business Machines Corporation
- Theodoros E. ANEMIKOS
- G01 - MEASURING TESTING