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Jeanne Paulette Spence Bickford
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Essex Junction, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and computer program product for semiconductor yield esti...
Patent number
8,136,066
Issue date
Mar 13, 2012
International Business Machines Corporation
Jeanne Paulette Spence Bickford
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Methods, apparatus, and program products to optimize semiconductor...
Patent number
7,917,451
Issue date
Mar 29, 2011
International Business Machines Corporation
Thomas S. Barnett
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of acceptance for semiconductor devices
Patent number
7,560,946
Issue date
Jul 14, 2009
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor yield estimation
Patent number
7,496,874
Issue date
Feb 24, 2009
Inetrnational Business Machines Corporation
Jeanne Paulette Spence Bickford
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Parametric-based semiconductor design
Patent number
7,487,477
Issue date
Feb 3, 2009
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS, APPARATUS, AND PROGRAM PRODUCTS TO OPTIMIZE SEMICONDUCTOR...
Publication number
20090234777
Publication date
Sep 17, 2009
International Business Machines Corporation
Thomas S. Barnett
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CU...
Publication number
20090224792
Publication date
Sep 10, 2009
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND COMPUTER PROGRAM PRODUCT FOR SEMICONDUCTOR YIELD ESTI...
Publication number
20090113364
Publication date
Apr 30, 2009
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of Acceptance for Semiconductor Devices
Publication number
20090039912
Publication date
Feb 12, 2009
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G01 - MEASURING TESTING
Information
Patent Application
PARAMETRIC-BASED SEMICONDUCTOR DESIGN
Publication number
20080148197
Publication date
Jun 19, 2008
International Business Machines Corporation
Jeanne Paulette Spence Bickford
G06 - COMPUTING CALCULATING COUNTING