Jed E. Davidow

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for monitoring a process by employing principa...
- Patent number 6,896,763
- Issue date May 24, 2005
- Lalitha Balasubramhanya
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness control using spectral interferometry
- Patent number 6,589,869
- Issue date Jul 8, 2003
- Applied Materials, Inc.
- Moshe Sarfaty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring a process by employing principa...
- Patent number 6,521,080
- Issue date Feb 18, 2003
- Applied Materials Inc.
- Lalitha Balasubramhanya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring the process state of a semicond...
- Patent number 6,455,437
- Issue date Sep 24, 2002
- Applied Materials Inc.
- Jed Davidow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness control using spectral interferometry
- Patent number 6,413,867
- Issue date Jul 2, 2002
- Applied Materials, Inc.
- Moshe Sarfaty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring a process by employing principa...
- Patent number 6,368,975
- Issue date Apr 9, 2002
- Applied Materials, Inc.
- Lalitha Balasubramhanya
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for monitoring a process by employing principa...
- Publication number 20030136511
- Publication date Jul 24, 2003
- Lalitha Balasubramhanya
- G05 - CONTROLLING REGULATING
Information Patent Application
Film thickness control using spectral interferometry
- Publication number 20020119660
- Publication date Aug 29, 2002
- Applied Materials, Inc.
- Moshe Sarfaty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for monitoring a process by employing principa...
- Publication number 20020055259
- Publication date May 9, 2002
- Lalitha Balasubramhanya
- G01 - MEASURING TESTING