Jedrzej Solecki

Person

Poznan, PL

People

Patents Grantslast 30 patents

Information Patent Grant
Test application time reduction using capture-per-cycle test points
- Patent number 10,509,072
- Issue date Dec 17, 2019
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain stitching for test-per-clock
- Patent number 10,379,161
- Issue date Aug 13, 2019
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic built-in self-test based on compressed test patterns...
- Patent number 9,933,485
- Issue date Apr 3, 2018
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Test-per-clock based on dynamically-partitioned reconfigurable scan...
- Patent number 9,714,981
- Issue date Jul 25, 2017
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Test generation for test-per-clock
- Patent number 9,347,993
- Issue date May 24, 2016
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Test-per-clock based on dynamically-partitioned reconfigurable scan...
- Patent number 9,335,377
- Issue date May 10, 2016
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain configuration for test-per-clock based on circuit topology
- Patent number 9,009,553
- Issue date Apr 14, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Fault-driven scan chain configuration for test-per-clock
- Patent number 9,003,248
- Issue date Apr 7, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test Application Time Reduction Using Capture-Per-Cycle Test Points
- Publication number 20180252768
- Publication date Sep 6, 2018
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
TEST-PER-CLOCK BASED ON DYNAMICALLY-PARTITIONED RECONFIGURABLE SCAN...
- Publication number 20160252573
- Publication date Sep 1, 2016
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Deterministic Built-In Self-Test
- Publication number 20160245863
- Publication date Aug 25, 2016
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Application
Fault-Driven Scan Chain Configuration For Test-Per-Clock
- Publication number 20140372820
- Publication date Dec 18, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Stitching For Test-Per-Clock
- Publication number 20140372821
- Publication date Dec 18, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Test Generation For Test-Per-Clock
- Publication number 20140372824
- Publication date Dec 18, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Test-Per-Clock Based On Dynamically-Partitioned Reconfigurable Scan...
- Publication number 20140372818
- Publication date Dec 18, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology
- Publication number 20140372819
- Publication date Dec 18, 2014
- Janusz Rajski
- G01 - MEASURING TESTING

Jedrzej Solecki

Person

Patents Grantslast 30 patents

Test application time reduction using capture-per-cycle test points

Scan chain stitching for test-per-clock

Deterministic built-in self-test based on compressed test patterns...

Test-per-clock based on dynamically-partitioned reconfigurable scan...

Test generation for test-per-clock

Test-per-clock based on dynamically-partitioned reconfigurable scan...

Scan chain configuration for test-per-clock based on circuit topology

Fault-driven scan chain configuration for test-per-clock

Patents Applicationslast 30 patents

Test Application Time Reduction Using Capture-Per-Cycle Test Points

TEST-PER-CLOCK BASED ON DYNAMICALLY-PARTITIONED RECONFIGURABLE SCAN...

Deterministic Built-In Self-Test

Fault-Driven Scan Chain Configuration For Test-Per-Clock

Scan Chain Stitching For Test-Per-Clock

Test Generation For Test-Per-Clock

Test-Per-Clock Based On Dynamically-Partitioned Reconfigurable Scan...

Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology