Jeena Mary George

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Kattappana, IN

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Patents Grantslast 30 patents

Information Patent Grant
TVF transition coverage with self-test and production-test time red...
- Patent number 12,146,911
- Issue date Nov 19, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Redundancy circuit
- Patent number 11,848,672
- Issue date Dec 19, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TVF TRANSITION COVERAGE WITH SELF-TEST AND PRODUCTION-TEST TIME RED...
- Publication number 20240402249
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
REDUNDANCY CIRCUIT
- Publication number 20230327674
- Publication date Oct 12, 2023
- STMicroelectronics International N.V.
- Sandeep Jain
- H03 - BASIC ELECTRONIC CIRCUITRY