Jeff Currin

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Routed event test system and method
- Patent number 8,295,182
- Issue date Oct 23, 2012
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Grant
System for linearizing a programmable delay circuit
- Patent number 6,330,197
- Issue date Dec 11, 2001
- Credence Systems Corporation
- Jeffrey D. Currin
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit tester with compensation for leakage current
- Patent number 6,194,911
- Issue date Feb 27, 2001
- Credence Systems Corporation
- Jeffrey D. Currin
- G01 - MEASURING TESTING
Information Patent Grant
Calibratable programmable phase shifter
- Patent number 6,104,223
- Issue date Aug 15, 2000
- Credence Systems Corporation
- D. James Chapman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit tester with test head including regulating capac...
- Patent number 6,087,843
- Issue date Jul 11, 2000
- Credence Systems Corporation
- Henry Yu-Hing Pun
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with compensation for leakage current
- Patent number 5,999,008
- Issue date Dec 7, 1999
- Credence Systems Corporation
- Jeffrey D. Currin
- G01 - MEASURING TESTING
Information Patent Grant
Coherent switching power for an analog circuit tester
- Patent number 5,883,523
- Issue date Mar 16, 1999
- Credence Systems Corporation
- Michael R. Ferland
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling timing of signal pulses
- Patent number 5,789,958
- Issue date Aug 4, 1998
- Credence Systems Corporation
- Douglas J. Chapman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compensated delay locked loop timing vernier
- Patent number 5,684,421
- Issue date Nov 4, 1997
- Credence Systems Corporation
- Douglas J. Chapman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ROUTED EVENT TEST SYSTEM AND METHOD
- Publication number 20090076761
- Publication date Mar 19, 2009
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Application
Multi-type test interface system and method
- Publication number 20080238461
- Publication date Oct 2, 2008
- Ken Skala
- G06 - COMPUTING CALCULATING COUNTING

Jeff Currin

Person

Patents Grantslast 30 patents

Routed event test system and method

System for linearizing a programmable delay circuit

Integrated circuit tester with compensation for leakage current

Calibratable programmable phase shifter

Integrated circuit tester with test head including regulating capac...

Integrated circuit tester with compensation for leakage current

Coherent switching power for an analog circuit tester

Apparatus for controlling timing of signal pulses

Compensated delay locked loop timing vernier

Patents Applicationslast 30 patents

ROUTED EVENT TEST SYSTEM AND METHOD

Multi-type test interface system and method