Jeff Markakis

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-axis positioning device
- Patent number 10,866,262
- Issue date Dec 15, 2020
- GETEC MICROSCOPY GMBH
- Peter Ziger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor wafer isolated transfer chuck
- Patent number 8,800,998
- Issue date Aug 12, 2014
- Multiprobe, Inc.
- Andrew N. Erickson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning probe microscope with compact scanner
- Patent number 8,474,060
- Issue date Jun 25, 2013
- Bruker Nano, Inc.
- Nghi Phan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fast-scanning SPM and method of operating same
- Patent number 7,770,231
- Issue date Aug 3, 2010
- Veeco Instruments, Inc.
- Craig Prater
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-AXIS POSITIONING DEVICE
- Publication number 20200141971
- Publication date May 7, 2020
- GETEC MICROSCOPY GMBH
- Peter ZIGER
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR WAFER ISOLATED TRANSFER CHUCK
- Publication number 20130168929
- Publication date Jul 4, 2013
- MULTIPROBE, INC.
- Andrew N. Erickson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Scanning probe microscope with compact scanner
- Publication number 20120278957
- Publication date Nov 1, 2012
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Application
Fast-Scanning SPM and Method of Operating Same
- Publication number 20090032706
- Publication date Feb 5, 2009
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING