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Jeff T. Sanders
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Tampa, FL, US
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last 30 patents
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Patent Grant
Measurement of point contact Andreev-reflection characteristics of...
Patent number
7,268,563
Issue date
Sep 11, 2007
University of South Florida
Srikanth Hariharan
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Measurement of Point Contact Andreev-Reflection Characteristics of...
Publication number
20070046297
Publication date
Mar 1, 2007
University of South Florida
Srikanth Hariharan
G01 - MEASURING TESTING