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Jeff W. Yost
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Tigard, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Method of controlling a sparse vector rasterizer
Patent number
6,384,825
Issue date
May 7, 2002
Tektronix, Inc.
Jeff W. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function digital persistence decay
Patent number
6,333,732
Issue date
Dec 25, 2001
Tektronix, Inc.
Paul M. Gerlach
G01 - MEASURING TESTING
Information
Patent Grant
Method of controlling brightness and contrast in a raster scan digi...
Patent number
6,249,115
Issue date
Jun 19, 2001
Tektronix, Inc.
Jeff W. Yost
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF CONTROLLING A SPARSE VECTOR RASTERIZER
Publication number
20010022588
Publication date
Sep 20, 2001
JEFF W. YOST
G01 - MEASURING TESTING