Jeff WANG

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Chu-Pei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Mechanisms for resistivity measurement of bump structures
- Patent number 8,742,776
- Issue date Jun 3, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- You-Hua Chou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MECHANISMS FOR RESISTIVITY MEASUREMENT OF BUMP STRUCTURES
- Publication number 20120133379
- Publication date May 31, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- You-Hua CHOU
- G01 - MEASURING TESTING