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Jeff Wight
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Aloha, OR, US
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last 30 patents
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Patent Grant
Method and apparatus for conducting input/output loop back tests us...
Patent number
6,477,674
Issue date
Nov 5, 2002
Intel Corporation
Sarah E. Bates
G01 - MEASURING TESTING
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Patent Grant
Pad cells for a 2/N mode clocking scheme
Patent number
5,862,373
Issue date
Jan 19, 1999
Intel Corporation
Chakrapani Pathikonda
G06 - COMPUTING CALCULATING COUNTING