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Jeff Wong
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Middleton, WI, US
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last 30 patents
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Patent Application
ADJUSTABLE OPTICAL SYSTEM FOR A SPECTROGRAPH
Publication number
20240361234
Publication date
Oct 31, 2024
Thermo Electron Scientific Instruments LLC
Julian Irwin
G01 - MEASURING TESTING
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Patent Application
Radiation Effects Testing System with a Beam Accelerator
Publication number
20240353358
Publication date
Oct 24, 2024
SHINE Technologies, LLC
Craig Jacobson
G01 - MEASURING TESTING