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Jeffery Allan Shepler
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Vadnais Heights, MN, US
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Patents Grants
last 30 patents
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Patent Grant
Probe systems, storage media, and methods for wafer-level testing o...
Patent number
10,060,963
Issue date
Aug 28, 2018
FormFactor Beaverton, Inc.
Timothy Allen McMullen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING O...
Publication number
20170285083
Publication date
Oct 5, 2017
Cascade Microtech, Inc.
Timothy Allen McMullen
G01 - MEASURING TESTING