Jeffery Bryan Abel

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Issaquah, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
- Patent number 9,111,331
- Issue date Aug 18, 2015
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION SYSTEM THAT INTEGRATES MANIFEST DATA WITH IMAGING/...
- Publication number 20130101172
- Publication date Apr 25, 2013
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING