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Jeffery C. Gannon
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Austin, TX, US
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last 30 patents
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Patent Grant
Method and apparatus for generation of test bitstreams and testing...
Patent number
6,101,864
Issue date
Aug 15, 2000
I/O Sensors, Inc.
Michael L. Abrams
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for generation of test bitstreams and testing...
Patent number
6,023,960
Issue date
Feb 15, 2000
I/O Sensors, Inc.
Michael L. Abrams
G01 - MEASURING TESTING