Jeffery H. Oppold

Person

Richmond, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dense register array for enabling scan out observation of both L1 a...
- Patent number 8,423,844
- Issue date Apr 16, 2013
- International Business Machines Corporation
- Pamela S. Gillis
- G01 - MEASURING TESTING
Information Patent Grant
Efficient circuit and method to measure resistance thresholds
- Patent number 7,613,047
- Issue date Nov 3, 2009
- International Business Machines Corporation
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for providing memory cells capable of allowing multiple vari...
- Patent number 7,237,215
- Issue date Jun 26, 2007
- International Business Machines Corporation
- Adam G. Moldovan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detector for alpha particle or cosmic ray
- Patent number 7,057,180
- Issue date Jun 6, 2006
- International Business Machines Corporation
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnosable scan chain
- Patent number 7,007,214
- Issue date Feb 28, 2006
- International Business Machines Corporation
- Steven Michael Eustis
- G01 - MEASURING TESTING
Information Patent Grant
Zero threshold voltage pFET and method of making same
- Patent number 7,005,334
- Issue date Feb 28, 2006
- International Business Machines Corporation
- Jeffrey S. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Redundancy register architecture for soft-error tolerance and metho...
- Patent number 7,000,155
- Issue date Feb 14, 2006
- International Business Machines Corporation
- Jeffery H. Oppold
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory having an adaptable latency
- Patent number 6,961,276
- Issue date Nov 1, 2005
- International Business Machines Corporation
- Francois Ibrahim Atallah
- G11 - INFORMATION STORAGE
Information Patent Grant
Zero Threshold Voltage pFET and method of making same
- Patent number 6,825,530
- Issue date Nov 30, 2004
- International Business Machines Corporation
- Jeffrey S. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-Test pattern to detect stuck open faults
- Patent number 6,442,085
- Issue date Aug 27, 2002
- International Business Machines Corporation
- Michael Thomas Fragano
- G11 - INFORMATION STORAGE
Information Patent Grant
Performance optimizing compiler for building a compiled SRAM
- Patent number 6,002,633
- Issue date Dec 14, 1999
- International Business Machines Corporation
- Jeffery H. Oppold
- G11 - INFORMATION STORAGE
Information Patent Grant
Precharged wordline decoder with locally-controlled clock
- Patent number 5,737,270
- Issue date Apr 7, 1998
- International Business Machines Corporation
- Jeffery H. Oppold
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated compact capacitor-resistor/inductor configuration
- Patent number 5,541,442
- Issue date Jul 30, 1996
- International Business Machines Corporation
- Richard F. Keil
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DENSE REGISTER ARRAY FOR ENABLING SCAN OUT OBSERVATION OF BOTH L1 A...
- Publication number 20120179944
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Pamela S. Gillis
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS TECHNIQUES TO REDUCE SIMULATIONS TO CHARACTERIZE THE EFFEC...
- Publication number 20080126061
- Publication date May 29, 2008
- Jerry D. Hayes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT CIRCUIT AND METHOD TO MEASURE RESISTANCE THRESHOLDS
- Publication number 20080084760
- Publication date Apr 10, 2008
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Application
Method for Providing Memory Cells Capable of Allowing Multiple Vari...
- Publication number 20060101366
- Publication date May 11, 2006
- International Business Machines Corporation
- Adam G. Moldovan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Random access memory having an adaptable latency
- Publication number 20050063211
- Publication date Mar 24, 2005
- International Business Machines Corporation
- Francois Ibrahim Atallah
- G11 - INFORMATION STORAGE
Information Patent Application
DETECTOR FOR ALPHA PARTICLE OR COSMIC RAY
- Publication number 20050012045
- Publication date Jan 20, 2005
- International Business Machines Corporation
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSABLE SCAN CHAIN
- Publication number 20040268195
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Steven Michael Eustis
- G01 - MEASURING TESTING
Information Patent Application
Zero threshold voltage pFET and method of making same
- Publication number 20040251475
- Publication date Dec 16, 2004
- International Business Machines Corporation
- Jeffrey S. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUNDANCY REGISTER ARCHITECTURE FOR SOFT-ERROR TOLERANCE AND METHO...
- Publication number 20040210802
- Publication date Oct 21, 2004
- International Business Machines Corporation
- Jeffery H. Oppold
- G11 - INFORMATION STORAGE
Information Patent Application
Method and design for measuring SRAM array leakage macro (ALM)
- Publication number 20040001376
- Publication date Jan 1, 2004
- International Business Machines Corporation
- Matthew J. Breitwisch
- G11 - INFORMATION STORAGE

Jeffery H. Oppold

Person

Patents Grantslast 30 patents

Dense register array for enabling scan out observation of both L1 a...

Efficient circuit and method to measure resistance thresholds

Method for providing memory cells capable of allowing multiple vari...

Detector for alpha particle or cosmic ray

Diagnosable scan chain

Zero threshold voltage pFET and method of making same

Redundancy register architecture for soft-error tolerance and metho...

Random access memory having an adaptable latency

Zero Threshold Voltage pFET and method of making same

Self-Test pattern to detect stuck open faults

Performance optimizing compiler for building a compiled SRAM

Precharged wordline decoder with locally-controlled clock

Integrated compact capacitor-resistor/inductor configuration

Patents Applicationslast 30 patents

DENSE REGISTER ARRAY FOR ENABLING SCAN OUT OBSERVATION OF BOTH L1 A...

ANALYSIS TECHNIQUES TO REDUCE SIMULATIONS TO CHARACTERIZE THE EFFEC...

EFFICIENT CIRCUIT AND METHOD TO MEASURE RESISTANCE THRESHOLDS

Method for Providing Memory Cells Capable of Allowing Multiple Vari...

Random access memory having an adaptable latency

DETECTOR FOR ALPHA PARTICLE OR COSMIC RAY

DIAGNOSABLE SCAN CHAIN

Zero threshold voltage pFET and method of making same

REDUNDANCY REGISTER ARCHITECTURE FOR SOFT-ERROR TOLERANCE AND METHO...

Method and design for measuring SRAM array leakage macro (ALM)