Jeffrey A. Hawkins

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,626,379
- Issue date Dec 1, 2009
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,436,170
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,250,752
- Issue date Jul 31, 2007
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,190,181
- Issue date Mar 13, 2007
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,842,024
- Issue date Jan 11, 2005
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,639,415
- Issue date Oct 28, 2003
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,489,789
- Issue date Dec 3, 2002
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,362,636
- Issue date Mar 26, 2002
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having inner and outer shielding
- Patent number 6,288,557
- Issue date Sep 11, 2001
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having inner and outer shielding
- Patent number 6,002,263
- Issue date Dec 14, 1999
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe station having multiple enclosures
- Publication number 20080048693
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20070247180
- Publication date Oct 25, 2007
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20060267610
- Publication date Nov 30, 2006
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20050062489
- Publication date Mar 24, 2005
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20040027144
- Publication date Feb 12, 2004
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20030038622
- Publication date Feb 27, 2003
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20020050831
- Publication date May 2, 2002
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20020027442
- Publication date Mar 7, 2002
- Ron A. Peters
- G01 - MEASURING TESTING

Jeffrey A. Hawkins

Person

Patents Grantslast 30 patents

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having inner and outer shielding

Probe station having inner and outer shielding

Patents Applicationslast 30 patents

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures